摘要
A new wall-conditioning method, ICRF plasma-assisted coating with silicon film, the so-called RF-siliconization, has been developed in HT-7 superconducting tokamak. It leads to suppression of carbon and oxygen impurities effectively. The properties of deposits were investigated by X-ray photoelectron spectroscopy (XPS). Silicon atoms have a large sticking probability on the wall and are practically less recycling. Plasma performance has been improved after ICRF siliconization.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1171-1175 |
| 页数 | 5 |
| 期刊 | Journal of Nuclear Materials |
| 卷 | 290-293 |
| DOI | |
| 出版状态 | 已出版 - 3月 2001 |
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