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ICRF siliconization in HT-7 superconducting tokamak

  • Xiangzu Gong
  • , Jiangang Li
  • , Baonian Wan
  • , Yanpin Zhao
  • , Xiaodong Zhang
  • , Xuemao Gu
  • , Chenfu Li
  • , Min Zhen
  • , Yinxian Jie
  • , Shouyin Zhang
  • , Zhenwei Wu

科研成果: 期刊稿件文章同行评审

16 引用 (Scopus)

摘要

A new wall-conditioning method, ICRF plasma-assisted coating with silicon film, the so-called RF-siliconization, has been developed in HT-7 superconducting tokamak. It leads to suppression of carbon and oxygen impurities effectively. The properties of deposits were investigated by X-ray photoelectron spectroscopy (XPS). Silicon atoms have a large sticking probability on the wall and are practically less recycling. Plasma performance has been improved after ICRF siliconization.

源语言英语
页(从-至)1171-1175
页数5
期刊Journal of Nuclear Materials
290-293
DOI
出版状态已出版 - 3月 2001

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