摘要
The accumulation of radiation-induced defect clusters and He bubble formation in He+ ion irradiated nanocrystalline TiO2 and Fe-TiO2 multilayer thin films were investigated using transmission electron microscopy (TEM). Prior to ion irradiation it was found that the crystallinity of TiO2 layers depends on the individual layer thickness: While all TiO2 layers are amorphous at 5 nm individual layer thickness, at 100 nm they are crystalline with a rutile polymorph. After He+ irradiation up to ∼6 dpa at room temperature, amorphization of TiO2 layers was not observed in both nanocrystalline TiO 2 single layers and Fe-TiO2 multilayers. The suppression of radiation-induced amorphization in TiO2 is interpreted in terms of a high density of defect sinks in these nano-composites in the form of Fe-TiO2 interphase boundaries and columnar grains within each layer with nano-scale intercolumnar porosity. In addition, a high concentration of He is believed to be trapped at these interfaces in the form of sub-nanometer-scale clusters retarding the formation of relatively larger He bubbles that can be resolved in TEM.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 96-101 |
| 页数 | 6 |
| 期刊 | Journal of Nuclear Materials |
| 卷 | 435 |
| 期 | 1-3 |
| DOI | |
| 出版状态 | 已出版 - 2013 |
| 已对外发布 | 是 |
学术指纹
探究 'He+ ion irradiation response of Fe-TiO2 multilayers' 的科研主题。它们共同构成独一无二的指纹。引用此
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