摘要
2D materials heterostructures are built by vertical stacking of solution-processed reduced graphene oxide (rGO) film and few-layer MoS2. The Raman and photoluminescence of the MoS2/rGO heterostructures show more significant peak shift compared to individual MoS2 or rGO film. The field-effect transistors (FETs) based on such MoS2/rGO heterostructures show ambipolar behavior in the dark but n-type behavior under illumination. This phenomenon provides a way to investigate the charge transport in valence band of MoS2. Due to charge separation caused by built-in potential at MoS2/rGO interface, the recombination of photoexcited electron–hole pairs is effectively suppressed, leading to high photoresponsivity (≈2.4 × 104 A W−1) and photogain (≈4.7 × 104) of the MoS2/rGO heterostructures in ambient air with modulation of gate bias and drain–source bias.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 1500267 |
| 期刊 | Advanced Electronic Materials |
| 卷 | 1 |
| 期 | 10 |
| DOI | |
| 出版状态 | 已出版 - 10月 2015 |
| 已对外发布 | 是 |
学术指纹
探究 'Gate-Tunable Ultrahigh Photoresponsivity of 2D Heterostructures Based on Few Layer MoS2 and Solution-Processed rGO' 的科研主题。它们共同构成独一无二的指纹。引用此
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