TY - GEN
T1 - Fault diagnosis based on deep learning
AU - Lv, Feiya
AU - Wen, Chenglin
AU - Bao, Zejing
AU - Liu, Meiqin
N1 - Publisher Copyright:
© 2016 American Automatic Control Council (AACC).
PY - 2016/7/28
Y1 - 2016/7/28
N2 - As representation scheme can severely limit the window by which the system observes its world, deep learning for fault diagnosis is put forward in this paper. It is a real time online scheme that can enhance the accuracy of detection, classification and prediction, and efficient for incipient faults that cannot be detected by traditional statistic technology. A stacked sparse auto encoder is used to learn the deep architectures of fault data to minimize the loss of information. Experiment results show that the proposed method not only improves the divisibility between faults and normal process, but also exhibits a better performance on the accuracy of fault classification for the chemical benchmark, Tennessee Eastman Process (TEP) data.
AB - As representation scheme can severely limit the window by which the system observes its world, deep learning for fault diagnosis is put forward in this paper. It is a real time online scheme that can enhance the accuracy of detection, classification and prediction, and efficient for incipient faults that cannot be detected by traditional statistic technology. A stacked sparse auto encoder is used to learn the deep architectures of fault data to minimize the loss of information. Experiment results show that the proposed method not only improves the divisibility between faults and normal process, but also exhibits a better performance on the accuracy of fault classification for the chemical benchmark, Tennessee Eastman Process (TEP) data.
KW - Deep learning
KW - Fault classification
KW - Fault detection
KW - Sparse auto encoding
UR - https://www.scopus.com/pages/publications/84988351296
U2 - 10.1109/ACC.2016.7526751
DO - 10.1109/ACC.2016.7526751
M3 - 会议稿件
AN - SCOPUS:84988351296
T3 - Proceedings of the American Control Conference
SP - 6851
EP - 6856
BT - 2016 American Control Conference, ACC 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 American Control Conference, ACC 2016
Y2 - 6 July 2016 through 8 July 2016
ER -