摘要
We fabricated a Si stencil X-ray mask only in a dry process without electroplating and chemical etching. An X-ray absorber of thickness 30 νm with vertical sidewalls was able to be fabricated. In addition, we succeeded in demonstration of the X-ray lithography in the beam line BL-4 of the synchrotron radiation facility TERAS of AIST. Line and space patterns of line width 2 - 200 νm were transcribed plainly on the surface of a PMMA sheet. It was confirmed that the edge of PMMA microstructures was sharp. There is a possibility that this Si stencil mask can be applied as an X-ray mask for the deep X-ray lithography.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 859-864 |
| 页数 | 6 |
| 期刊 | Journal of Physics: Conference Series |
| 卷 | 34 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 1 4月 2006 |
| 已对外发布 | 是 |
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