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Fabrication of a Si stencil mask for the X-ray lithography using a dry etching technique

  • National Institute of Advanced Industrial Science and Technology

科研成果: 期刊稿件文章同行评审

10 引用 (Scopus)

摘要

We fabricated a Si stencil X-ray mask only in a dry process without electroplating and chemical etching. An X-ray absorber of thickness 30 νm with vertical sidewalls was able to be fabricated. In addition, we succeeded in demonstration of the X-ray lithography in the beam line BL-4 of the synchrotron radiation facility TERAS of AIST. Line and space patterns of line width 2 - 200 νm were transcribed plainly on the surface of a PMMA sheet. It was confirmed that the edge of PMMA microstructures was sharp. There is a possibility that this Si stencil mask can be applied as an X-ray mask for the deep X-ray lithography.

源语言英语
页(从-至)859-864
页数6
期刊Journal of Physics: Conference Series
34
1
DOI
出版状态已出版 - 1 4月 2006
已对外发布

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