Estimation of Far-field Errors due to Probe Jitter in Planar Near-field Measurement Based on Interval Analysis Method

This work presents an effective error estimation method for planar near-field measurements. The proposed method uses interval analysis (IA) to estimate the range of errors in the far-field radiation pattern caused by probe jitter. During planar near-field measurements, the jitter of the probe in the introduces random errors in the amplitudes and phases of the electric field on the sampling plane, and there will be errors the derived far-field radiation patter from this set of data Based on the efficiency, inclusiveness and reliability of the IA in calculating complex-valued intervals, an analytical method is proposed for estimating the far-field radiation pattern errors. This estimation method, based on IA, can be used to analyze the effect of random errors in amplitude and phase of the near-field electric field data on the radiation pattern.