摘要
The maximum electromechanical property of piezoelectric ceramic is normally achieved at morphotropic phase boundary. Herein, we found that a maximum electrostrain is obtained in single rhombohedral phase region at the tricritical point (which is a single rhombohedral phase at room temperature) for BaTi1−xHfxO3 ceramics. The mechanism for electrostrain enhancement at tricritical point (TTP) was uncovered by analyzing its crystallographic feature. The results show that TTP (x = 0.11) exhibits largest electrostrain (S = 0.063%) at room temperature. And the TTP reveals a maximum crystallite size (66.3 nm) and minimum lattice strain (0.7 × 10−4). Further Raman results demonstrate a lowest Raman intensity occurs at TTP, which confirmed the specific crystallographic behavior. Therefore, a minimum lattice strain-induced low elastic energy could lower landau free energy, which is responsible for electrostrain enhancement at TTP. This work may provide a new insight for understanding and designing large electromechanical ceramics.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 5388-5394 |
| 页数 | 7 |
| 期刊 | Journal of Materials Engineering and Performance |
| 卷 | 29 |
| 期 | 8 |
| DOI | |
| 出版状态 | 已出版 - 1 8月 2020 |
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