Electron-impact-induced dissociation of small argon clusters

Thomas Pflüger; Xueguang Ren; Alexander Dorn

doi:10.1103/PhysRevA.91.052701

Electron-impact-induced dissociation of small argon clusters

Thomas Pflüger
, Xueguang Ren
, Alexander Dorn

Physikalisch-Technische Bundesanstalt
Max Planck Institute for Nuclear Physics

科研成果: 期刊稿件 › 文章 › 同行评审

19 引用（Scopus）

摘要

We study electron-impact-induced dissociation of small van der Waals-bound argon complexes at a projectile energy of 120 eV. Kinetic-energy-release (KER) spectra of the Ar2 and Ar3 parent species for the final charge states 2Ar+, Ar++Ar2+, and Ar2++Ar+ and electron energies have been measured together with angular distributions of fragment ions. They are used to identify dissociation mechanisms such as interatomic Coulombic decay (ICD).

源语言	英语
期刊论文编号	052701
期刊	Physical Review A - Atomic, Molecular, and Optical Physics
卷	91
期	5
DOI	https://doi.org/10.1103/PhysRevA.91.052701
出版状态	已出版 - 6 5月 2015
已对外发布	是

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Electron-impact-induced dissociation of small argon clusters

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