摘要
Polyimide (PI)-matrix composite films containing titanium dioxide (TiO 2) nanoparticles and layered montmorillonite (MMT) have been fabricated by employing in-situ polymerization and their microstructure has been investigated by synchrotron radiation small angle X-ray scattering, wide-angle X-ray diffraction and scanning electron microscopy. The effects of mixture doping concentration on volume resistivity, loss tangent, permittivity, and breakdown field strength are analyzed. The breakdown field strength of TiO 2 and MMT doped PI nanocomposite (PTM) shows a maximum value at the inorganic content of 5 wt.%, which is 10% higher than that of comparable two-component PI/TiO2 nanocomposite films. Meanwhile, the tri-layered PTM/PI/PTM nanocomposite film, prepared by in-situ polymerization, exhibits improved electrical properties than that of the monolayer PTM film.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 352-356 |
| 页数 | 5 |
| 期刊 | Thin Solid Films |
| 卷 | 544 |
| DOI | |
| 出版状态 | 已出版 - 1 10月 2013 |
| 已对外发布 | 是 |
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