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Effect of Micron-scale and Nanoscale Boron Nitride Fillers on Arc Ablation Resistance of Polytetrafluoroethylene

  • Bingchen Song
  • , Zhaozi Zhang
  • , Yongjie Nie
  • , Shengtao Li
  • , Daomin Min
  • , Chuanchuan Wang
  • , Tao Zhao
  • Xi'an Jiaotong University
  • Xi'an XD High Voltage Appapatus Co. Ltd.

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

During the breaking process of high voltage circuit breaker (HVCB), the arcs generated between the contacts may cause severe ablation of the nozzle, shortening the life of HVCB. Therefore, it is necessary to study the nozzle material with better ablation resistance. Polytetrafluoroethylene (PTFE)/boron nitride (BN) composite materials are commonly used in the industry to prepare nozzles. The particle size of BN can affect the ablation resistance of PTFE/BN composites, but the law is still unclear. In this paper, several kinds of PTFE composite samples doped with different nanoscale and micron-scale BN were prepared to study the effect of BN size on ablation resistance. The experimental results show that micron-scale BN fillers are more effective for improving the ablation resistance. With the increase of micron-scale BN particle size, the arc ablation resistance becomes better first and then worsens. The results are discussed and explained from the perspective of thermal transport and spectral reflectance characteristics.

源语言英语
主期刊名Proceedings of the 2020 IEEE 3rd International Conference on Dielectrics, ICD 2020
出版商Institute of Electrical and Electronics Engineers Inc.
257-260
页数4
ISBN(电子版)9781728189833
DOI
出版状态已出版 - 5 7月 2020
活动3rd IEEE International Conference on Dielectrics, ICD 2020 - Virtual, Valencia, 西班牙
期限: 5 7月 20209 7月 2020

出版系列

姓名Proceedings of the 2020 IEEE 3rd International Conference on Dielectrics, ICD 2020

会议

会议3rd IEEE International Conference on Dielectrics, ICD 2020
国家/地区西班牙
Virtual, Valencia
时期5/07/209/07/20

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