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Effect of a thin Cr layer on the microstructures and fracture behaviours of copper films

  • Henan University of Science and Technology
  • Xi'an Jiaotong University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

An investigation on Cu/Cr/Si composite thin films demonstrated that a thin Cr layer affects the microstructures and mechanical behavior of Cu films significantly. The fracture modes changes from brittle fracture to ductile rupture, as indicated by the dimpled rupture of Cu films. Moreover, the Cr sticking layer can result in carrot-shaped rods and a fine grain size. Further analysis indicates their deformation and fracture processes are closely related to the coupling of dislocation-mediated plasticity as well as the formation and growth of voids which act as sites for nucleation of the dimples.

源语言英语
主期刊名Advanced Engineering Materials
2376-2379
页数4
DOI
出版状态已出版 - 2011
活动2nd International Conference on Manufacturing Science and Engineering, ICMSE 2011 - Guilin, 中国
期限: 9 4月 201111 4月 2011

丛书

姓名Advanced Materials Research
194-196
ISSN(印刷版)1022-6680

会议

会议2nd International Conference on Manufacturing Science and Engineering, ICMSE 2011
国家/地区中国
Guilin
时期9/04/1111/04/11

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