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Dielectric property analysis for the different charge defects in SiO2 based on the first principles

  • Xiaojun Xie
  • , Yonghong Cheng
  • , Kai Wu
  • , Xiaolin Chen
  • , Mang Li
  • , Lili Jiang
  • , Caixin Sun
  • Xi'an Jiaotong University

科研成果: 会议稿件论文同行评审

1 引用 (Scopus)

摘要

In this paper, we establish the different defects species and the different charge states models, including the intrinsic and extrinsic defects, in the α-quartz system. The models for different defects have been optimized within the first principles. Furthermore, the formation energies for defect structures in the α-quartz system have been computed. We can deduce the easiest generated defect in the α-quartz system through the formation energies as a function of the Fermi level. From the simulation results, it is concluded that Al3+-Na+ defect is the most possible defect type at the low temperature, and then at the high temperature, the interstitial O2- is the most possible defect type. Finally from the band structure, we also find that the interstitial O2- and Al 3+-Na+ defect are the shallow defect level in the energy band. And they become the very important accept defects in α-quartz.

源语言英语
526-529
页数4
DOI
出版状态已出版 - 2008
活动2008 International Symposium on Electrical Insulating Materials, ISEIM 2008 - Yokkaichi, 日本
期限: 7 9月 200811 9月 2008

会议

会议2008 International Symposium on Electrical Insulating Materials, ISEIM 2008
国家/地区日本
Yokkaichi
时期7/09/0811/09/08

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