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Dark-current of field-assisted GaAs semiconductor photocathodes

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The dark-current of GaAs field-assisted photocathodes with red and near infrared response is larger than that of common GaAs photocathodes. The major source of dark-current of the photocathodes is impact ionization of hot holes in high field depletion region. In this paper, a model and creating mechanism of impact ionization in the photocathodes is described in detail, and a specific expression of the dark-current of the photocathodes at different operation conditions can be predicted once the appropriate parameters have been determined. It may be helpful to design a field-assisted photocathode and choose an optimum operation condition.

源语言英语
主期刊名Proceedings of SPIE - The International Society for Optical Engineering
编辑Da-Heng Wang
出版商Publ by Int Soc for Optical Engineering
43-45
页数3
ISBN(印刷版)0819402737
出版状态已出版 - 1990
已对外发布
活动International Conference on Optoelectronic Science and Engineering '90 - Beijing, China
期限: 22 8月 199025 8月 1990

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
1230
ISSN(印刷版)0277-786X

会议

会议International Conference on Optoelectronic Science and Engineering '90
Beijing, China
时期22/08/9025/08/90

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