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Current envelope analysis for defect identification and diagnosis in induction motors

  • Jinjiang Wang
  • , Shaopeng Liu
  • , Robert X. Gao
  • , Ruqiang Yan
  • University of Connecticut

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Increasing demand in reliable manufacturing systems has been accelerating research in condition monitoring and defect diagnosis of vital machine components. This paper investigates defect diagnosis of induction motors, which are widely used in manufacturing systems as a source of actuation. A new approach, based on feature extraction from the envelope of the motor current instead of the motor current itself, has been investigated. This is based on the consideration that motor current envelope is effective in revealing the amplitude-modulated nature of the motor current signal. Three pattern classifiers - Naïve Bayes, k-nearest neighbor, and Support Vector Machine, have been investigated for defect classification. Experimental results have demonstrated that the new feature extraction and selection method yields a higher degree of accuracy than the traditional method for motor defect classification.

源语言英语
主期刊名40th North American Manufacturing Research Conference 2012 - Transactions of the North American Manufacturing Research Institution of SME
157-165
页数9
出版状态已出版 - 2012
已对外发布
活动40th Annual North American Manufacturing Research Conference, NAMRC40 - Notre Dame, IN, 美国
期限: 4 6月 20128 6月 2012

出版系列

姓名Transactions of the North American Manufacturing Research Institution of SME
40
ISSN(印刷版)1047-3025

会议

会议40th Annual North American Manufacturing Research Conference, NAMRC40
国家/地区美国
Notre Dame, IN
时期4/06/128/06/12

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