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Column-by-column observation of dislocation motion in CdTe: Dynamic scanning transmission electron microscopy

  • Chen Li
  • , Yu Yang Zhang
  • , Timothy J. Pennycook
  • , Yelong Wu
  • , Andrew R. Lupini
  • , Naba Paudel
  • , Sokrates T. Pantelides
  • , Yanfa Yan
  • , Stephen J. Pennycook
  • University of Vienna
  • Oak Ridge National Laboratory
  • Vanderbilt University
  • University of Toledo
  • National University of Singapore

科研成果: 期刊稿件文章同行评审

13 引用 (Scopus)

摘要

The dynamics of partial dislocations in CdTe have been observed at the atomic scale using aberration-corrected scanning transmission electron microscopy (STEM), allowing the mobility of different dislocations to be directly compared: Cd-core Shockley partial dislocations are more mobile than Te-core partials, and dislocation cores with unpaired columns have higher mobility than those without unpaired columns. The dynamic imaging also provides insight into the process by which the dislocations glide. Dislocations with dangling bonds on unpaired columns are found to be more mobile because the dangling bonds mediate the bond exchanges required for the dislocations to move. Furthermore, a screw dislocation has been resolved to dissociate into a Shockley partial-dislocation pair along two different directions, revealing a way for the screw dislocation to glide in the material. The results show that dynamic STEM imaging has the potential to uncover the details of dislocation motion not easily accessible by other means.

源语言英语
文章编号143107
期刊Applied Physics Letters
109
14
DOI
出版状态已出版 - 3 10月 2016

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