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Collaboration Better Than Integration: A Novel Time-Frequency-Assisted Deep Feature Enhancement Mechanism for Few-Shot Transfer Learning in Anomaly Detection

  • Wentao Mao
  • , Jianing Wu
  • , Shubin Du
  • , Ke Feng
  • , Zidong Wang
  • Henan Normal University
  • Engineering Laboratory of Intelligence Business & Internet of Things of Henan Province
  • HBIS Group Tangsteel Company
  • National University of Singapore
  • Brunel University London

科研成果: 期刊稿件文章同行评审

摘要

Deep transfer learning has achieved significant success in anomaly detection over the past decade, but data acquisition challenges in practical engineering hinder high-quality feature representation for few-shot learning tasks. To address this issue, a novel time-frequency-assisted deep feature enhancement (TFE) mechanism is proposed. Unlike traditional methods that integrate time-frequency analysis with deep neural networks, TFE employs a wavelet scattering transform to establish a parallel time-frequency feature space, where a dual interaction strategy facilitates collaboration between deep feature and time-frequency spaces through two operations: 1) Enhancement, where a frequency-importance-driven contrastive learning (FICL) network transfers physically-aware information from wavelet scattering features to deep features, and 2) Feedback, which uses a detection rule adaptation module to minimize bias in wavelet scattering features based on deep feature performance. TFE is applied to a domain-adversarial anomaly detection framework and, through alternating training, significantly enhances both deep feature discriminative power and few-shot anomaly detection. Theoretical analysis confirms that the proposed dual interaction strategy reduces the upper bound of classification error. Experiments on benchmark datasets and a real-world industrial dataset from a large steel factory demonstrate TFE’s superior performance and highlight the importance of frequency saliency in transfer learning. Thus, collaboration is shown to outperform integration for few-shot transfer learning in anomaly detection.

源语言英语
页(从-至)366-382
页数17
期刊IEEE/CAA Journal of Automatica Sinica
13
2
DOI
出版状态已出版 - 2026

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