TY - JOUR
T1 - Charge collection efficiency of chemical vapor deposition diamond film detector to alpha-particles
AU - Lei, Lan
AU - Ouyang, Xiaoping
AU - Cao, Na
AU - Zhang, Xianpeng
AU - Wang, Lan
AU - Zhong, Yunhong
PY - 2009/7
Y1 - 2009/7
N2 - The energy spectrum of the developed sandwich chemical vapor deposition (CVD) diamond film detector to alpha-particles, has been measured by experiments at room temperature, for 241Am source with a characteristic energy of 5.485 MeV and 243Am and 244Cm source with characteristic energies of 5.275 MeV and 5.805 MeV respectively. The trend of the charge collection efficiency changing with biased voltage was obtained, and the mean efficiency under different biased voltages and that at 10% of the trailing edge of the spectrum were also calculated. Results show that the performance of the detector is steady, and the charge collection efficiency of the detector to alpha-particles increases with the biased voltage increasing and is saturated at a certain biased voltage. The saturated mean charge collection efficiency can be 33.5%, and can reach 57% when calculated at the 10% of the trailing edge.
AB - The energy spectrum of the developed sandwich chemical vapor deposition (CVD) diamond film detector to alpha-particles, has been measured by experiments at room temperature, for 241Am source with a characteristic energy of 5.485 MeV and 243Am and 244Cm source with characteristic energies of 5.275 MeV and 5.805 MeV respectively. The trend of the charge collection efficiency changing with biased voltage was obtained, and the mean efficiency under different biased voltages and that at 10% of the trailing edge of the spectrum were also calculated. Results show that the performance of the detector is steady, and the charge collection efficiency of the detector to alpha-particles increases with the biased voltage increasing and is saturated at a certain biased voltage. The saturated mean charge collection efficiency can be 33.5%, and can reach 57% when calculated at the 10% of the trailing edge.
KW - Charge collection efficiency
KW - Chemical vapor deposition
KW - Diamond film
KW - Particle detect
KW - Radiation measurement
KW - Semiconductor detector
UR - https://www.scopus.com/pages/publications/68249089683
M3 - 文章
AN - SCOPUS:68249089683
SN - 1001-4322
VL - 21
SP - 1083
EP - 1087
JO - Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams
JF - Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams
IS - 7
ER -