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Characterisation of ultra-narrow band filters for diode laser systems based on dense wavelength division multiplexing

  • David Rubel
  • , Ulrich Witte
  • , Stefan Hengesbach
  • , Martin Traub
  • , Dieter Hoffmann
  • Fraunhofer Institute for Laser Technology

科研成果: 书/报告/会议事项章节会议稿件同行评审

2 引用 (Scopus)

摘要

We present a measurement platform to characterise combining elements used for dense wavelength division multiplexing, such as dielectric edge filters or Volume Bragg Gratings (notch filters). This platform enables the characterisation of the spectral and angular selectivity, the homogeneity of reflectance or transmittance and temperature-induced spectral shift of the band edge. The determination of the diffraction efficiency, the reflectance and the transmittance is carried out for both polarisations with high accuracy.

源语言英语
主期刊名Proceedings of the 2015 High Power Diode Lasers and Systems Conference, HPD 2015 - Co-located with Photonex 2015
出版商Institute of Electrical and Electronics Engineers Inc.
15-16
页数2
ISBN(电子版)9781467391788
DOI
出版状态已出版 - 22 3月 2016
已对外发布
活动High Power Diode Lasers and Systems Conference, HPD 2015 - Coventry, 英国
期限: 14 10月 201515 10月 2015

出版系列

姓名Proceedings of the 2015 High Power Diode Lasers and Systems Conference, HPD 2015 - Co-located with Photonex 2015

会议

会议High Power Diode Lasers and Systems Conference, HPD 2015
国家/地区英国
Coventry
时期14/10/1515/10/15

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