@inbook{c0844b65589243a7b742a353bfcffa1f,
title = "Chapter 11 Atomic-Resolution Aberration-Corrected Transmission Electron Microscopy",
abstract = "An overview of the current state of aberration-corrected transmission electron microscopy (TEM) with an emphasis on atomic-resolution studies in materials science is presented. The new contrast theory for aberration-corrected TEM includes the fact that the added freedom of variable spherical aberration may be used together with the variable defocus to create contrast conditions substantially improved with respect to Scherzer conditions. The availability of aberration-corrected instruments has enabled the use of TEM in atomic-resolution studies for various materials. Aberration-corrected instruments can be used to determine accuracy in the picometer range for the high-precision measurement of atomic displacements. Atomic-resolution aberration-corrected EM can also provides new insight into atomic structures.",
author = "Knut Urban and Lothar Houben and Jia, \{Chun Lin\} and Markus Lentzen and Mi, \{Shao Bo\} and Andreas Thust and Karsten Tillmann",
year = "2008",
doi = "10.1016/S1076-5670(08)01011-2",
language = "英语",
isbn = "9780123742209",
series = "Advances in Imaging and Electron Physics",
publisher = "Academic Press Inc.",
pages = "439--480",
booktitle = "Advances in IMAGING AND ELECTRON PHYSICS Aberration-Corrected Electron Microscopy",
}