TY - GEN
T1 - Capacitor Health Evaluation Method Considering Stochasticity from Multiple Independent Sources
AU - Lv, Chunlin
AU - Liu, Jinjun
AU - Zhang, Yan
AU - Li, Yang
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - The capacitors health status is receiving increasing attention. However, the common used failure-of-physics modeling methods reveal the average performance of capacitor aging failure, but cannot explain the stochastic phenomena in practical applications. Therefore, this paper proposed a capacitor health status evaluation method considering stochasticity from multiple independent sources. Firstly, the stochastic phenomena and sources in capacitor failure process are summarized comprehensively, and the characterization methods of internal parameter randomness and external condition randomness are given respectively. Then, Monte Carlo simulation and dynamic stress-strength interference theory are used to solve the modeling of aging failure and sudden failure, and the series model theory is used to form a composite failure probability to describe the health state of capacitors. Finally, the effectiveness of the proposed method is verified by accelerated aging experiments.
AB - The capacitors health status is receiving increasing attention. However, the common used failure-of-physics modeling methods reveal the average performance of capacitor aging failure, but cannot explain the stochastic phenomena in practical applications. Therefore, this paper proposed a capacitor health status evaluation method considering stochasticity from multiple independent sources. Firstly, the stochastic phenomena and sources in capacitor failure process are summarized comprehensively, and the characterization methods of internal parameter randomness and external condition randomness are given respectively. Then, Monte Carlo simulation and dynamic stress-strength interference theory are used to solve the modeling of aging failure and sudden failure, and the series model theory is used to form a composite failure probability to describe the health state of capacitors. Finally, the effectiveness of the proposed method is verified by accelerated aging experiments.
KW - Monte Carlo simulation
KW - capacitor health
KW - stochasticity modeling
KW - stress-strength interference
UR - https://www.scopus.com/pages/publications/85187293013
U2 - 10.1109/PEAS58692.2023.10395879
DO - 10.1109/PEAS58692.2023.10395879
M3 - 会议稿件
AN - SCOPUS:85187293013
T3 - PEAS 2023 - 2023 IEEE 2nd International Power Electronics and Application Symposium, Conference Proceedings
SP - 1901
EP - 1906
BT - PEAS 2023 - 2023 IEEE 2nd International Power Electronics and Application Symposium, Conference Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd IEEE International Power Electronics and Application Symposium, PEAS 2023
Y2 - 10 November 2023 through 13 November 2023
ER -