TY - JOUR
T1 - BiDNet
T2 - A Real-Time Semantic Segmentation Network With Antifeature Interference and Detail Recovery for Industrial Defects
AU - Pan, Jiawei
AU - Zeng, Deyu
AU - Wu, Zongze
AU - Xie, Shengli
N1 - Publisher Copyright:
© 1963-2012 IEEE.
PY - 2025
Y1 - 2025
N2 - In recent years, there has been an increasing demand for surface defect detection with the development of intelligent manufacturing. The semantic segmentation is suitable for achieving precise and intelligent surface defect detection. However, three issues prevail in current surface defect segmentation methods: feature interference, detail missing, and computationally expensive. To address these limitations, we propose the bilateral decoder network (BiDNet), a novel real-time semantic segmentation framework with shallow and deep branches. Computationally expensive is due to the high resolution of the shallow feature maps. To solve this problem, BiDNet uses shallow branches for shallow feature maps with a high resolution to ensure speed and deep branches for deep feature maps with a low resolution to guarantee accuracy. Feature interference is caused by the direct fusion of deep feature maps of different sizes. To solve this problem, we propose a multiscale feature channel attention (MFCA) mechanism to compute the contribution of feature maps from different layers and accordingly fuse them better. The detail missing is due to the gradual downsampling in the encoder stage. To solve this problem, we propose a multiscale feature spatial attention (MFSA) mechanism to compute the importance of each position of the feature map for different branches to recover the details better. Extensive experiments on mobile phone screen surface defect (MSD), magnetic tile defect (MTD), and our glass surface defect (GSD) dataset show that our performance consistently outperforms the state of the art. The code is available at: https://github.com/jiaweipan997/BiDNet.
AB - In recent years, there has been an increasing demand for surface defect detection with the development of intelligent manufacturing. The semantic segmentation is suitable for achieving precise and intelligent surface defect detection. However, three issues prevail in current surface defect segmentation methods: feature interference, detail missing, and computationally expensive. To address these limitations, we propose the bilateral decoder network (BiDNet), a novel real-time semantic segmentation framework with shallow and deep branches. Computationally expensive is due to the high resolution of the shallow feature maps. To solve this problem, BiDNet uses shallow branches for shallow feature maps with a high resolution to ensure speed and deep branches for deep feature maps with a low resolution to guarantee accuracy. Feature interference is caused by the direct fusion of deep feature maps of different sizes. To solve this problem, we propose a multiscale feature channel attention (MFCA) mechanism to compute the contribution of feature maps from different layers and accordingly fuse them better. The detail missing is due to the gradual downsampling in the encoder stage. To solve this problem, we propose a multiscale feature spatial attention (MFSA) mechanism to compute the importance of each position of the feature map for different branches to recover the details better. Extensive experiments on mobile phone screen surface defect (MSD), magnetic tile defect (MTD), and our glass surface defect (GSD) dataset show that our performance consistently outperforms the state of the art. The code is available at: https://github.com/jiaweipan997/BiDNet.
KW - Bilateral decoder network (BiDNet)
KW - industrial defect detection
KW - multiscale feature channel attention (MFCA)
KW - multiscale feature spatial attention (MFSA)
KW - real-time semantic segmentation
UR - https://www.scopus.com/pages/publications/105001653145
U2 - 10.1109/TIM.2025.3548182
DO - 10.1109/TIM.2025.3548182
M3 - 文章
AN - SCOPUS:105001653145
SN - 0018-9456
VL - 74
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
M1 - 5017916
ER -