Beam induced fluorescence (BIF) monitor for intense heavy ion beams

Non-intercepting Beam Induced Fluorescence (BIF) monitors measure transversal beam profiles by observation of fluorescence light originating from excited residual gas molecules. Thus they are an alternative to conventional intercepting devices. Single photon counting is performed using an image intensified digital CCD camera. We investigated the BIF process in the energy range of 7.7 keV/u to 750 MeV/u in residual nitrogen. Experiments at low beam energies were performed at a Marx-accelerator (NDCX) at Berkeley Lab [1] whereas mid and high energy experiments were carried out at GSI accelerators [2, 3]. Especially in the vicinity of targets the neutron-generated radiation level limits the monitor's signal to background ratio. Therefore the radiation background was investigated for different ion species and particle energies. Background simulations using a Monte Carlo transport code are compared to experimental data taken with scintillators, thermo luminescence detectors and the BIF monitor. Alternative image intensifier techniques are presented as well as shielding concepts. Furthermore the dynamics of ionized nitrogen molecules in the electric field of intense ion beams is discussed.