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Audee: Automated Testing for Deep Learning Frameworks

  • Qianyu Guo
  • , Xiaofei Xie
  • , Yi Li
  • , Xiaoyu Zhang
  • , Yang Liu
  • , Xiaohong Li
  • , Chao Shen
  • Tianjin University
  • Nanyang Technological University
  • Xi'an Jiaotong University

科研成果: 书/报告/会议事项章节会议稿件同行评审

109 引用 (Scopus)

摘要

Deep learning (DL) has been applied widely, and the quality of DL system becomes crucial, especially for safety-critical applications. Existing work mainly focuses on the quality analysis of DL models, but lacks attention to the underlying frameworks on which all DL models depend. In this work, we propose Audee, a novel approach for testing DL frameworks and localizing bugs. Audee adopts a search-based approach and implements three different mutation strategies to generate diverse test cases by exploring combinations of model structures, parameters, weights and inputs. Audee is able to detect three types of bugs: logical bugs, crashes and Not-a-Number (NaN) errors. In particular, for logical bugs, Audee adopts a cross-reference check to detect behavioural inconsistencies across multiple frameworks (e.g., TensorFlow and PyTorch), which may indicate potential bugs in their implementations. For NaN errors, Audee adopts a heuristic-based approach to generate DNNs that tend to output outliers (i.e., too large or small values), and these values are likely to produce NaN. Furthermore, Audee leverages a causal-testing based technique to localize layers as well as parameters that cause inconsistencies or bugs. To evaluate the effectiveness of our approach, we applied Audee on testing four DL frameworks, i.e., TensorFlow, PyTorch, CNTK, and Theano. We generate a large number of DNNs which cover 25 widely-used APIs in the four frameworks. The results demonstrate that Audee is effective in detecting inconsistencies, crashes and NaN errors. Intotal, 26 unique unknown bugs were discovered, and 7 of them have already been confirmed or fixed by the developers.

源语言英语
主期刊名Proceedings - 2020 35th IEEE/ACM International Conference on Automated Software Engineering, ASE 2020
出版商Institute of Electrical and Electronics Engineers Inc.
486-498
页数13
ISBN(电子版)9781450367684
DOI
出版状态已出版 - 9月 2020
活动35th IEEE/ACM International Conference on Automated Software Engineering, ASE 2020 - Virtual, Melbourne, 澳大利亚
期限: 22 9月 202025 9月 2020

出版系列

姓名Proceedings - 2020 35th IEEE/ACM International Conference on Automated Software Engineering, ASE 2020

会议

会议35th IEEE/ACM International Conference on Automated Software Engineering, ASE 2020
国家/地区澳大利亚
Virtual, Melbourne
时期22/09/2025/09/20

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