Atomic structure imaging using an aberration-corrected transmission electron microscope

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1 引用（Scopus）

源语言	英语
页（从-至）	48-49
页数	2
期刊	Microscopy and Microanalysis
卷	9
期	SUPPL. 3
DOI	https://doi.org/10.1017/s1431927603012108
出版状态	已出版 - 2003
已对外发布	是

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@article{8808779f923944e3b3827917d53e9478,

title = "Atomic structure imaging using an aberration-corrected transmission electron microscope",

author = "Markus Lentzen and Jia, \{Chun Lin\} and Knut Urban",

year = "2003",

doi = "10.1017/s1431927603012108",

language = "英语",

volume = "9",

pages = "48--49",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 3",

}

TY - JOUR

T1 - Atomic structure imaging using an aberration-corrected transmission electron microscope

AU - Lentzen, Markus

AU - Jia, Chun Lin

AU - Urban, Knut

PY - 2003

Y1 - 2003

UR - https://www.scopus.com/pages/publications/0142092260

U2 - 10.1017/s1431927603012108

DO - 10.1017/s1431927603012108

M3 - 文章

AN - SCOPUS:0142092260

SN - 1431-9276

VL - 9

SP - 48

EP - 49

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 3

ER -