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Analytical loss model of low voltage enhancement mode GaN HEMTs

  • Xi'an Jiaotong University

科研成果: 书/报告/会议事项章节会议稿件同行评审

5 引用 (Scopus)

摘要

An analytical model is proposed in this paper to calculate the switching loss of low voltage enhancement mode Gallium Nitride high electron mobility transistors (eGaN HEMTs). The switching process is illustrated in detail. The switching loss is obtained by solving the equivalent circuits during the switching transition. A good agreement is shown between the analytical model and Spice simulation results. In addition, in order to accurately measure the current transition waveform, a novel current measuring method based on magnetic coupling is proposed. Finally, a buck converter is designed to validate the accuracy of the proposed model.

源语言英语
主期刊名2014 IEEE Energy Conversion Congress and Exposition, ECCE 2014
出版商Institute of Electrical and Electronics Engineers Inc.
100-105
页数6
ISBN(电子版)9781479956982
DOI
出版状态已出版 - 11 11月 2014

丛书

姓名2014 IEEE Energy Conversion Congress and Exposition, ECCE 2014

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