TY - GEN
T1 - An improved method of parameter abstraction for a novel diode reverse recovery model in time-domain simulation
AU - Wang, Hao
AU - Liu, Jinjun
AU - Wang, Runxin
AU - Fang, Qian
PY - 2008
Y1 - 2008
N2 - Based on the Lauritzen and Ma model, diode model with reverse recovery characteristic can be built following a modeling procedure presented in the authors' previous paper. But using the original modeling procedure, the diode model will cause large error on peak reverse current in some cases. Defect analysis and improvement of the modeling procedure are present in this paper. By revealing that the averaging of τand TM in different conditions causes the diode model with large error on peak reverse current evaluation, new τand TM derivation method is proposed to improve the modeling procedure. Following the proposed modeling procedure, the diode model can be built and fits in with different implementation in dc-dc converters and PFC circuit. Simulation and hardware tests are done to verify that the diode models with the proposed modeling procedure are greatly improved in the peak reverse current in different implementation cases.
AB - Based on the Lauritzen and Ma model, diode model with reverse recovery characteristic can be built following a modeling procedure presented in the authors' previous paper. But using the original modeling procedure, the diode model will cause large error on peak reverse current in some cases. Defect analysis and improvement of the modeling procedure are present in this paper. By revealing that the averaging of τand TM in different conditions causes the diode model with large error on peak reverse current evaluation, new τand TM derivation method is proposed to improve the modeling procedure. Following the proposed modeling procedure, the diode model can be built and fits in with different implementation in dc-dc converters and PFC circuit. Simulation and hardware tests are done to verify that the diode models with the proposed modeling procedure are greatly improved in the peak reverse current in different implementation cases.
UR - https://www.scopus.com/pages/publications/49249083387
U2 - 10.1109/APEC.2008.4522949
DO - 10.1109/APEC.2008.4522949
M3 - 会议稿件
AN - SCOPUS:49249083387
SN - 9781424418749
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 1664
EP - 1668
BT - 2008 23rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC
T2 - 2008 23rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC
Y2 - 24 February 2008 through 28 February 2008
ER -