摘要
An enhancement-mode hydrogen-terminated diamond field-effect transistor (FET) is realized by using a low work function gate material, namely, lanthanum hexaboride (LaB6). The reason for the enhancement mode should be that the electrons in the LaB6 layer flow into the two-dimensional hole gas (2DHG) channel and compensate the holes, such that the channel is shut down. The threshold voltages (V TH) range from - 0.29 V to - 0.72 V with different gate lengths. The device with 2 μ m gate length shows a - 57.9 mA/mm maximum drain current density (I DSmax) at VGS=-5 V. The on/off ratio is around 9 orders of magnitude, with a subthreshold swing of 130 mV. Effective mobility (μ eff) as high as 195.4 cm2/ V · s is obtained from the device. This technique reveals undamaged 2 DHG characteristics, uncontaminated interface between LaB6 and aluminum gate metal, and a simple fabrication process, which will promote the development of enhancement diamond FETs.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 8986577 |
| 页(从-至) | 585-588 |
| 页数 | 4 |
| 期刊 | IEEE Electron Device Letters |
| 卷 | 41 |
| 期 | 4 |
| DOI | |
| 出版状态 | 已出版 - 4月 2020 |
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