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Amorphous Si TFTs on plastically deformed spherical domes

  • P. I. Hsu
  • , H. Gleskova
  • , M. Huang
  • , Z. Suo
  • , S. Wagner
  • , J. C. Sturm
  • Princeton University

科研成果: 期刊稿件文章同行评审

25 引用 (Scopus)

摘要

There is a growing interest in the design and fabrication of flexible and rugged electronics particularly for large-area displays and sensor arrays. In this work, we describe the fabrication of amorphous silicon (a-Si:H) thin film transistors (TFTs) on a Kapton® substrate which can be permanently deformed into a spherical cap shape. This level of strain would crack uniform a-Si:H device films. To prevent fractures in our TFT structure, the silicon and silicon nitride layers of the TFTs are patterned to create isolated device islands. After deformation, these brittle islands can remain crack-free, and the TFTs achieve comparable device behavior despite average strain in the substrate in excess of 5%.

源语言英语
页(从-至)1355-1359
页数5
期刊Journal of Non-Crystalline Solids
299-302
PART 2
DOI
出版状态已出版 - 4月 2002
已对外发布

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