AFM study of lamellar structure of melt-crystallized n-alkane C 390H782

A. Tracz; G. Ungar

doi:10.1021/ma050494q

AFM study of lamellar structure of melt-crystallized n-alkane C ₃₉₀H₇₈₂

A. Tracz
, G. Ungar

Polish Academy of Sciences
University of Sheffield

科研成果: 期刊稿件 › 文章 › 同行评审

26 引用（Scopus）

摘要

The morphology of alkane C₃₉₀H₇₈₂ using the substrate detachment technique for studies of melt crystallized PE ^18-20 by atomic force microscopy (AFM) was investigated. The surface of the polymer sample crystallized in contact with an atomically flat substrate was exposed by gentle detachment from the substrate. Rectangular silicon cantilevers model RTESP7 were used in the investigation. It was observed that a range of morphologies, formed during nonisothermal crystallization can be observed at different distances from the substrate.

源语言	英语
页（从-至）	4962-4965
页数	4
期刊	Macromolecules
卷	38
期	12
DOI	https://doi.org/10.1021/ma050494q
出版状态	已出版 - 14 6月 2005
已对外发布	是

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10.1021/ma050494q

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abstract = "The morphology of alkane C390H782 using the substrate detachment technique for studies of melt crystallized PE 18-20 by atomic force microscopy (AFM) was investigated. The surface of the polymer sample crystallized in contact with an atomically flat substrate was exposed by gentle detachment from the substrate. Rectangular silicon cantilevers model RTESP7 were used in the investigation. It was observed that a range of morphologies, formed during nonisothermal crystallization can be observed at different distances from the substrate.",

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AU - Ungar, G.

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N2 - The morphology of alkane C390H782 using the substrate detachment technique for studies of melt crystallized PE 18-20 by atomic force microscopy (AFM) was investigated. The surface of the polymer sample crystallized in contact with an atomically flat substrate was exposed by gentle detachment from the substrate. Rectangular silicon cantilevers model RTESP7 were used in the investigation. It was observed that a range of morphologies, formed during nonisothermal crystallization can be observed at different distances from the substrate.

AB - The morphology of alkane C390H782 using the substrate detachment technique for studies of melt crystallized PE 18-20 by atomic force microscopy (AFM) was investigated. The surface of the polymer sample crystallized in contact with an atomically flat substrate was exposed by gentle detachment from the substrate. Rectangular silicon cantilevers model RTESP7 were used in the investigation. It was observed that a range of morphologies, formed during nonisothermal crystallization can be observed at different distances from the substrate.

UR - https://www.scopus.com/pages/publications/21644458375

U2 - 10.1021/ma050494q

DO - 10.1021/ma050494q

M3 - 文章

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JO - Macromolecules

JF - Macromolecules

IS - 12

ER -

AFM study of lamellar structure of melt-crystallized n-alkane C 390H782

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AFM study of lamellar structure of melt-crystallized n-alkane C ₃₉₀H₇₈₂