TY - GEN
T1 - A Time-Series Segmentation and Contrastive Learning Method for Fault Diagnosis of Rotating Machinery
AU - Xi, Yue
AU - Lei, Zihao
AU - Fan, Jinsong
AU - Shan, Song
AU - Su, Yu
AU - Wen, Guangrui
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - The reliability and stability of rotating machinery are critical to industrial productivity and safety. In this study, a novel multi-fault diagnosis method for rotating machinery is proposed, combining time series segmentation and contrast learning techniques. The method effectively improves the accuracy of fault classification by segmenting raw sensor signals and extracting robust feature representations using contrast learning. We evaluate the performance of the method on the publicly available dataset and show that it outperforms existing methods in terms of both fault classification accuracy and generalization ability. This research provides an efficient and scalable solution for predictive maintenance strategies in industrial environments.
AB - The reliability and stability of rotating machinery are critical to industrial productivity and safety. In this study, a novel multi-fault diagnosis method for rotating machinery is proposed, combining time series segmentation and contrast learning techniques. The method effectively improves the accuracy of fault classification by segmenting raw sensor signals and extracting robust feature representations using contrast learning. We evaluate the performance of the method on the publicly available dataset and show that it outperforms existing methods in terms of both fault classification accuracy and generalization ability. This research provides an efficient and scalable solution for predictive maintenance strategies in industrial environments.
KW - contrastive learning
KW - fault diagnosis
KW - time-series analysis
KW - time-series segmentation
UR - https://www.scopus.com/pages/publications/105001668766
U2 - 10.1109/ICSMD64214.2024.10920563
DO - 10.1109/ICSMD64214.2024.10920563
M3 - 会议稿件
AN - SCOPUS:105001668766
T3 - ICSMD 2024 - 5th International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence
BT - ICSMD 2024 - 5th International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 5th International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence, ICSMD 2024
Y2 - 31 October 2024 through 3 November 2024
ER -