TY - GEN
T1 - A research on the surface charge with different coating tip by Electrostatic Force Microscope
AU - Sun, Zhi
AU - Wang, Xuan
AU - Song, Wei
AU - Lei, Qingquan
PY - 2013
Y1 - 2013
N2 - Electrostatic Force Microscope (EFM) is applied to study of the properties of surface charge of polyimide films in micro-nanometer scale. The charge was injected by different kind of coating tips to the surface of polyimide films. After that the surface charge was characterized by EFM, the result indicated that it was difficult to inject charge with Pt/Ir coating tip for larger work function than Co/Cr coating. The mechanism of electron emission electrode in the experiment is mainly hot electron emission, but also accompanied by field emission. So the barrier height between metal and dielectric had massive influence on the process of Charge injection. This research provides a new method for study on the rule and mechanism of surface charge on the insulated films.
AB - Electrostatic Force Microscope (EFM) is applied to study of the properties of surface charge of polyimide films in micro-nanometer scale. The charge was injected by different kind of coating tips to the surface of polyimide films. After that the surface charge was characterized by EFM, the result indicated that it was difficult to inject charge with Pt/Ir coating tip for larger work function than Co/Cr coating. The mechanism of electron emission electrode in the experiment is mainly hot electron emission, but also accompanied by field emission. So the barrier height between metal and dielectric had massive influence on the process of Charge injection. This research provides a new method for study on the rule and mechanism of surface charge on the insulated films.
UR - https://www.scopus.com/pages/publications/84901740517
U2 - 10.1109/CEIDP.2013.6748244
DO - 10.1109/CEIDP.2013.6748244
M3 - 会议稿件
AN - SCOPUS:84901740517
SN - 9781479925964
T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SP - 295
EP - 297
BT - 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013
T2 - 2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013
Y2 - 20 October 2013 through 23 October 2013
ER -