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A Novel Image-Graph Heterogeneous Fusion Framework for Static IR Drop Prediction

  • Dan Niu
  • , Dekang Zhang
  • , Yichao Cao
  • , Zhou Jin
  • , Chao Wang
  • , Yichao Dong
  • , Changyin Sun
  • Southeast University, Nanjing
  • Zhejiang University
  • Anhui University

科研成果: 书/报告/会议事项章节会议稿件同行评审

2 引用 (Scopus)

摘要

IR drop analysis is crucial for ensuring the reliability and performance of integrated circuits (ICs) but poses computational challenges as the IC designs grow larger, especially for ultra deep-submicron VLSI designs. Deep learnings (DL) as the efficiency-promising solutions, mainly employ various CNN-based networks to achieve image-to-image IR drop predictions. However, they neglect and lose the power delivery network (PDN) global spatial features and cell instance topological information. This paper proposes a novel image-graph heterogeneous fusion framework (IGHF), which integrates the effectiveness and complementarity of dual branches (CNN and GNN) for higher prediction performance. In the CNN-based Power ScaleFusion Unet branch, the proposed long-range and local-detail encoder (LLE) integrates seamlessly with the hierarchical and adjacent compensation group (HACG) module. This design facilitates effective multi-scale global-to-local spatial power feature extraction within the PDN and enables adaptive high-to-low-level feature fusion and compensation in the decoder. Moreover, a cell voltage aware (CVA) module in the GNN branch is designed to adaptively aggregate PDN topological features of heterogeneous neighbors of different orders. Comparative experiments demonstrate that the proposed IGHF achieves significant accuracy improvements, outperforming the state-of-the-art MAUNet and widely-used IREDGe methods by considerable margins of 24.6% and 55.0% reduction in prediction error, while the prediction maps possess higher structural fidelity. Transfer experiments indicate that IGHF with transfer learning can improve the accuracy in real circuits with the few-shot real circuit test cases.

源语言英语
主期刊名2025 62nd ACM/IEEE Design Automation Conference, DAC 2025
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798331503048
DOI
出版状态已出版 - 2025
已对外发布
活动62nd ACM/IEEE Design Automation Conference, DAC 2025 - San Francisco, 美国
期限: 22 6月 202525 6月 2025

出版系列

姓名Proceedings - Design Automation Conference
ISSN(印刷版)0738-100X

会议

会议62nd ACM/IEEE Design Automation Conference, DAC 2025
国家/地区美国
San Francisco
时期22/06/2525/06/25

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