A method to process the row-noise in image of near-field optical scanning microscopy

In the system with a mode of scanning, such as the near-field optical scanning microscopy, the image produced has big row-noise due to many kinds of reasons. In this case, the traditional methods, like average and Fourier filter, are not good at eliminating the row-noise. Two new methods, adaptive iterative and wavelet analysis, are proposed in this article. Wavelet-analysis is able to be localized in the time-frequency domain, and its window of time and frequency can be adjusted, therefore, the row-noise is able to be detected and Location of the noise can be realized. These processes prove to be effective in experiments.