TY - GEN
T1 - A high-speed image super-resolution algorithm based on sparse representation for MEMS defect detection
AU - Li, Xiuyuan
AU - Zhao, Yulong
AU - Hu, Tengjiang
AU - Zhang, Qi
AU - Li, Yingxue
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/11/28
Y1 - 2016/11/28
N2 - A novel high- speed image super-resolution algorithm based on sparse representation for MEMS defect detection is proposed in this paper. Traditional super-resolution algorithms adopt a single dictionary to represent images, which cannot differentiate varieties of image blocks and leads to slow processing speed. Aiming at overcoming this shortage of traditional super-resolution algorithms, image blocks are divided into different categories by local features and each of these categories possesses the corresponding high and low resolution dictionary pairs. Experimental results of different MEMS defects show that the improved algorithm can obtain images of little lower quality with much less processing time, indicating that the proposed algorithm is more suitable for MEMS defect detection.
AB - A novel high- speed image super-resolution algorithm based on sparse representation for MEMS defect detection is proposed in this paper. Traditional super-resolution algorithms adopt a single dictionary to represent images, which cannot differentiate varieties of image blocks and leads to slow processing speed. Aiming at overcoming this shortage of traditional super-resolution algorithms, image blocks are divided into different categories by local features and each of these categories possesses the corresponding high and low resolution dictionary pairs. Experimental results of different MEMS defects show that the improved algorithm can obtain images of little lower quality with much less processing time, indicating that the proposed algorithm is more suitable for MEMS defect detection.
KW - MEMS defect detection
KW - fast
KW - image super-resolution
KW - sparse representation
UR - https://www.scopus.com/pages/publications/85007256913
U2 - 10.1109/NEMS.2016.7758239
DO - 10.1109/NEMS.2016.7758239
M3 - 会议稿件
AN - SCOPUS:85007256913
T3 - 2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016
SP - 229
EP - 232
BT - 2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th IEEE Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016
Y2 - 17 April 2016 through 20 April 2016
ER -