A complex permittivity measurement technique for high dielectric constant materials at microwave frequency

Song Xia; Zhuo Xu; Xiaoyong Wei

doi:10.1080/00150193.2010.484735

A complex permittivity measurement technique for high dielectric constant materials at microwave frequency

Song Xia
, Zhuo Xu
, Xiaoyong Wei

电子与信息学部

Xi'an Jiaotong University

科研成果: 期刊稿件 › 会议文章 › 同行评审

2 引用（Scopus）

摘要

The measurement uncertainty of traditional transmission/reflection method is very poor for high dielectric constant (>100) materials or sample whose thickness was several integer multiples of half wavelength. A modified calculating procedure was presented for measuring the high dielectric constant materials. The method is based on the thickness resonance when electromagnetic wave is transmitting through transmission line filled with the sample. It is convenient for complex permittivity measurement of high dielectric constant materials with transmission/reflection method.

源语言	英语
页（从-至）	101-107
页数	7
期刊	Ferroelectrics
卷	407
期	1
DOI	https://doi.org/10.1080/00150193.2010.484735
出版状态	已出版 - 2010
活动	12th International Meeting on Ferroelectricity, IMF-12 and the 18th IEEE International Symposium on Applications of Ferroelectrics, ISAF-18 - Xi'an, 中国期限: 23 8月 2009 → 27 8月 2009

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abstract = "The measurement uncertainty of traditional transmission/reflection method is very poor for high dielectric constant (>100) materials or sample whose thickness was several integer multiples of half wavelength. A modified calculating procedure was presented for measuring the high dielectric constant materials. The method is based on the thickness resonance when electromagnetic wave is transmitting through transmission line filled with the sample. It is convenient for complex permittivity measurement of high dielectric constant materials with transmission/reflection method.",

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AU - Xia, Song

AU - Xu, Zhuo

AU - Wei, Xiaoyong

PY - 2010

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N2 - The measurement uncertainty of traditional transmission/reflection method is very poor for high dielectric constant (>100) materials or sample whose thickness was several integer multiples of half wavelength. A modified calculating procedure was presented for measuring the high dielectric constant materials. The method is based on the thickness resonance when electromagnetic wave is transmitting through transmission line filled with the sample. It is convenient for complex permittivity measurement of high dielectric constant materials with transmission/reflection method.

AB - The measurement uncertainty of traditional transmission/reflection method is very poor for high dielectric constant (>100) materials or sample whose thickness was several integer multiples of half wavelength. A modified calculating procedure was presented for measuring the high dielectric constant materials. The method is based on the thickness resonance when electromagnetic wave is transmitting through transmission line filled with the sample. It is convenient for complex permittivity measurement of high dielectric constant materials with transmission/reflection method.

UR - https://www.scopus.com/pages/publications/79955695851

U2 - 10.1080/00150193.2010.484735

DO - 10.1080/00150193.2010.484735

M3 - 会议文章

AN - SCOPUS:79955695851

SN - 0015-0193

VL - 407

SP - 101

EP - 107

JO - Ferroelectrics

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T2 - 12th International Meeting on Ferroelectricity, IMF-12 and the 18th IEEE International Symposium on Applications of Ferroelectrics, ISAF-18

Y2 - 23 August 2009 through 27 August 2009

ER -

A complex permittivity measurement technique for high dielectric constant materials at microwave frequency

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