TY - GEN
T1 - A Cable Defect Location and Assessment Method Based on the Hilbert-Enveloped Reflection Coefficient
AU - Zou, Xingyu
AU - Mu, Haibao
AU - Wang, Renjie
AU - Song, Ci
AU - Fan, Kaixuan
AU - Cheng, Ziqian
AU - Zhang, Guanjun
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - Time-frequency domain reflectometry is a sensitive method for locating cable defects. However, common time-frequency domain reflectometry methods cannot assess the severity of the located defects, which may lead to unnecessary cable replacement. Therefore, a cable defect location and assessment method based on the Hilbert-enveloped reflection coefficient is proposed in this paper. The method extracts the attenuation curves of the incident signal through the propagation coefficients to avoid the errors caused by the signal attenuation. In addition, the refraction compensation factor is proposed to avoid the extra errors caused by the reflection and refraction of defect signal. In simulation and experiments, the defect location errors are all less than 1 %, and the assessment errors are less than 6 %. The method is expected to locate cable defects and assess their severity.
AB - Time-frequency domain reflectometry is a sensitive method for locating cable defects. However, common time-frequency domain reflectometry methods cannot assess the severity of the located defects, which may lead to unnecessary cable replacement. Therefore, a cable defect location and assessment method based on the Hilbert-enveloped reflection coefficient is proposed in this paper. The method extracts the attenuation curves of the incident signal through the propagation coefficients to avoid the errors caused by the signal attenuation. In addition, the refraction compensation factor is proposed to avoid the extra errors caused by the reflection and refraction of defect signal. In simulation and experiments, the defect location errors are all less than 1 %, and the assessment errors are less than 6 %. The method is expected to locate cable defects and assess their severity.
KW - Hilbert-enveloped reflection coefficient
KW - cable defect
KW - location and assessment
KW - time-frequency domain reflectometry
UR - https://www.scopus.com/pages/publications/85202290355
U2 - 10.1109/ICD59037.2024.10613155
DO - 10.1109/ICD59037.2024.10613155
M3 - 会议稿件
AN - SCOPUS:85202290355
T3 - Proceedings of the 2024 IEEE 5th International Conference on Dielectrics, ICD 2024
BT - Proceedings of the 2024 IEEE 5th International Conference on Dielectrics, ICD 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 5th IEEE International Conference on Dielectrics, ICD 2024
Y2 - 30 June 2024 through 4 July 2024
ER -