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A Cable Defect Location and Assessment Method Based on the Hilbert-Enveloped Reflection Coefficient

  • Xingyu Zou
  • , Haibao Mu
  • , Renjie Wang
  • , Ci Song
  • , Kaixuan Fan
  • , Ziqian Cheng
  • , Guanjun Zhang
  • Xi'an Jiaotong University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Time-frequency domain reflectometry is a sensitive method for locating cable defects. However, common time-frequency domain reflectometry methods cannot assess the severity of the located defects, which may lead to unnecessary cable replacement. Therefore, a cable defect location and assessment method based on the Hilbert-enveloped reflection coefficient is proposed in this paper. The method extracts the attenuation curves of the incident signal through the propagation coefficients to avoid the errors caused by the signal attenuation. In addition, the refraction compensation factor is proposed to avoid the extra errors caused by the reflection and refraction of defect signal. In simulation and experiments, the defect location errors are all less than 1 %, and the assessment errors are less than 6 %. The method is expected to locate cable defects and assess their severity.

源语言英语
主期刊名Proceedings of the 2024 IEEE 5th International Conference on Dielectrics, ICD 2024
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798350308976
DOI
出版状态已出版 - 2024
活动5th IEEE International Conference on Dielectrics, ICD 2024 - Toulouse, 法国
期限: 30 6月 20244 7月 2024

出版系列

姓名Proceedings of the 2024 IEEE 5th International Conference on Dielectrics, ICD 2024

会议

会议5th IEEE International Conference on Dielectrics, ICD 2024
国家/地区法国
Toulouse
时期30/06/244/07/24

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