摘要
In a wide variety of high-power pulsed devices, the megavolt switch plays a key role in the system performance. A capacitance-resistance coupling structure was designed to produce UV light which triggered the switch to decrease the breakdown jitter. High-speed electrical measurements with a circuit integrating probe in the nanosecond range were employed to measure the voltage before the switch. From the experimental results, the breakdown characteristic of a 3-MV UV-illumination switch was obtained in the range of 1.6-2.5 MV: The jitter of the breakdown voltage is lower than 25 kV, and the jitter of the breakdown time is shorter than 5 ns.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 6418044 |
| 页(从-至) | 360-364 |
| 页数 | 5 |
| 期刊 | IEEE Transactions on Plasma Science |
| 卷 | 41 |
| 期 | 2 |
| DOI | |
| 出版状态 | 已出版 - 2013 |
| 已对外发布 | 是 |
学术指纹
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