X-ray spectromicroscopy of fast heavy ions and target radiation

  • O. N. Rosmej
  • , J. Wieser
  • , M. Geissel
  • , F. Rosmej
  • , A. Blakevic
  • , J. Jacoby
  • , E. Dewald
  • , M. Roth
  • , E. Brambrinz
  • , K. Weyrich
  • , D. H.H. Hoffmann
  • , T. A. Pikuz
  • , A. Ya Faenov
  • , A. I. Magunov
  • , I. Yu Skobelev
  • , N. G. Borisenko
  • , V. P. Shevelko
  • , A. A. Golubev
  • , A. Fertman
  • , V. Turtikov
  • B. Yu Sharkov

Research output: Contribution to journalArticlepeer-review

27 Scopus citations

Abstract

A new technique for X-ray spectromicroscopy of fast heavy ion radiation during the ion interaction with stopping media is presented using focusing spectrometers with spatial resolution. Spherically bent crystals of quartz and mica with small curvature radii, R=150mm, and large apertures were used as dispersive elements in experiments on fast Ni ions with energies of 5.9 and 11.2MeV/u which are being stopped in different media: Ar gas, SiO2-aerogels and solid quartz. Spectrally high (λ/Δλ=1000-3000) and spatially high (up to 10-100μm) resolved Kα-satellite spectra of Ni projectiles as well as of the ionized stopping media were observed.

Original languageEnglish
Pages (from-to)29-39
Number of pages11
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume495
Issue number1
DOIs
StatePublished - 1 Dec 2002
Externally publishedYes

Keywords

  • Doppler shift
  • Focusing crystal spectrometer
  • Kα-satellites
  • Projectile ion radiation
  • Stopping power
  • X-ray spectroscopy

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