X-ray emission of hollow atoms formed by highly charged argon and xenon ions below a beryllium surface

  • Yongtao Zhao
  • , Guoqing Xiao
  • , Xiaoan Zhang
  • , Zhihu Yang
  • , Yanping Zhang
  • , Wenlong Zhan
  • , Ximeng Chen
  • , Fuli Li

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

The X-ray emission induced by highly charged argon and xenon ions impinging on a beryllium surface is investigated. It is found that spectra of the X-ray induced by Ar17,18+ interacting with the surface are very different from those of the X-ray induced by Ar17,18+ interacting with residual gases. The result provides an experimental evidence for the existence of hollow atoms below the surface. Several unexpected X-ray lines are also found in the experiment. Firstly, K X-rays are observed when Ar16+ ions which initially have no K shell holes interact with the surface. Secondly, if there are more than 2 M shell vacancies at the initial time, strong Mαα two-electron-one-photon (TEOP) transitions are found in the collisions of Xe28+,29+,30+ ions with the surface.

Original languageEnglish
Pages (from-to)121-124
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume258
Issue number1
DOIs
StatePublished - May 2007
Externally publishedYes

Keywords

  • Direct recombination (DR)
  • Highly charged ion (HCI)
  • Hollow atom (HA)
  • TEOP transitions
  • X-rays

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