Skip to main navigation Skip to search Skip to main content

X-ray emission from 424-MeV/u C ions impacting on selected target

  • Xian Ming Zhou
  • , Rui Cheng
  • , Yu Lei
  • , Yuan Bo Sun
  • , Yu Yu Wang
  • , Xing Wang
  • , Ge Xu
  • , Ce Xiang Mei
  • , Xiao An Zhang
  • , Xi Meng Chen
  • , Guo Qing Xiao
  • , Yong Tao Zhao

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

The K-shell x-rays of Ti, V, Fe, Co, Ni, Cu, and Zn induced by 424-MeV/u C6+ ion impact are measured. It is found that the K x-ray shifts to the high energy side and the intensity ratio of Kβ/Kα is larger than the atomic data, owing to the L-shell multiple-ionization. The x-ray production cross sections are deduced from the experimental counts and compared with the binary encounter approximation (BEA), plane wave approximation (PWBA) and energy-loss Coulomb-repulsion perturbed-stationary-state relativistic (ECPSSR) theoretical predictions. The BEA model with considering the multiple-ionization fluorescence yield is in better consistence with the experimental results. In addition, the cross section as a function of target atomic K-shell binding energy is presented.

Original languageEnglish
Article number023402
JournalChinese Physics B
Volume25
Issue number2
DOIs
StatePublished - 10 Jan 2016

Keywords

  • high energy heavy ions
  • ionatom collisions
  • x-ray emission

Fingerprint

Dive into the research topics of 'X-ray emission from 424-MeV/u C ions impacting on selected target'. Together they form a unique fingerprint.

Cite this