X 射线成像闪烁体光产额测量技术与优化方法

Scintillation imaging screens are critical components in X-ray imaging technology. The accurate measurement of their light yield plays a pivotal role in improving the spatial resolution of imaging systems and advancing the development of new scintillators. This paper first provides an overview of the basic principles of X-ray imaging technology，followed by a review of the main methods for measuring light yield in X-ray imaging scintillators. These methods include relative measurement techniques based on energy spectra and X-ray excitation spectra，as well as absolute measurement methods using photomultiplier tubes（PMTs）and photodiodes（PDs）or avalanche photodiodes（APDs）. Additionally，this paper summarizes the potential impacts of various factors on light yield measurements，such as packaging and coupling technologies，the energy characteristics of the radiation source，particle types，and the types of photodetectors used for light yield measurements. Furthermore，an absolute light yield measurement method is proposed based on correcting the light collection efficiency. This method effectively combines the advantages of the absolute measurement techniques using PMTs and PDs，achieving wide-range light yield measurements（covering light outputs at the hundred-photons level）while maintaining a low measurement uncertainty of 5%.