Utilizing Polarization and Multidimensional Spatial Angle-Resolved Spectroscopy to Reveal the Optical Anisotropy of Few-Layer Bi₂O₂Se

The novel ternary 2D material Bi₂O₂Se exhibits numerous unique properties in the optical discipline due to its distinctive structure, rendering it of significant research importance and application potential in the domains of new-generation microelectronics, optoelectronic sensors, and multidimensional optical recognition. However, the optical anisotropy and multidimensional angular resolution of Bi₂O₂Se have yet to be investigated under the condition of 3D spatial variation of incidence angle. Herein, the spatial optical sensing of the few-layer Bi₂O₂Se is investigated under 3D spatially varying incidence conditions using a combination of polarized Raman spectroscopy and multidimensional angle-resolved spectroscopy. By manipulating the incident angle conditions and adjusting the sample placement angle, a comprehensive optical characterization of materials from diverse spatial orientations is conducted. It is observed that few-layer Bi₂O₂Se exhibits a systematically transformed multidimensional spatial photoresponse within visible and near-infrared wavelengths. This demonstrates the capability of Bi₂O₂Se as photosensitive semiconductors for 3D stereo optical detection. Furthermore, finite difference time domain simulations reveal that the spatial optical anisotropy of few-layer Bi₂O₂Se can be manifested under 3D variable-angle incidence conditions. The work serves as a crucial guide for the future of Bi₂O₂Se in anisotropic integrated optics applications, based on polarization-based chiral recognition.