Skip to main navigation Skip to search Skip to main content

Unleashing the Potential of All Test Samples: Mean-Shift Guided Test-Time Adaptation

  • Jizhou Han
  • , Chenhao Ding
  • , Songlin Dong
  • , Xinyuan Gao
  • , Qiang Wang
  • , Yuhang He
  • , Yihong Gong
  • Xi'an Jiaotong University
  • Shenzhen University of Advanced Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Visual-language models (VLMs) like CLIP exhibit strong generalization but struggle with distribution shifts at test time. Existing training-free test-time adaptation (TTA) methods operate strictly within CLIP’s original feature space, relying on high-confidence samples while overlooking the potential of low-confidence ones. We propose MS-TTA, a training-free approach that enhances feature representations beyond CLIP’s space using a single-step k-nearest neighbors (kNN) Mean-Shift. By refining all test samples, MS-TTA improves feature compactness and class separability, leading to more stable adaptation. Additionally, a cache of refined embeddings further enhances inference by providing Mean-Shift-enhanced logits. Extensive evaluations on OOD and Cross-Dataset Benchmarks demonstrate that MS-TTA consistently outperforms state-of-the-art training-free TTA methods, achieving robust adaptation without requiring additional training.

Keywords

  • CLIP
  • K-nearest neighbors
  • Mean-Shift
  • Test-time adaptation
  • Visual-language models

Fingerprint

Dive into the research topics of 'Unleashing the Potential of All Test Samples: Mean-Shift Guided Test-Time Adaptation'. Together they form a unique fingerprint.

Cite this