Unique buckling and post-buckling behavior of Cu–Zr amorphous films on compliant substrates

K. Wu; Y. Q. Wang; H. Z. Yuan; J. Y. Zhang; G. Liu; J. Sun

doi:10.1016/j.matlet.2018.11.095

Unique buckling and post-buckling behavior of Cu–Zr amorphous films on compliant substrates

K. Wu
, Y. Q. Wang
, H. Z. Yuan
, J. Y. Zhang
, G. Liu
, J. Sun

School of Materials Science and Engineering

Xi'an Jiaotong University

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

The buckling and post-buckling behavior of the Cu–Zr amorphous films is highly dependent on film thickness (h) and applied strain (ε). A buckling map has been developed with h and ε as axes, where four buckling modes are detected, including uncracked triangular buckle, cracked rectangular buckle, cracked triangular buckle, and patches. Formation of the four buckling modes will be discussed in terms of the film thickness and size-dependent deformation.

Original language	English
Pages (from-to)	118-121
Number of pages	4
Journal	Materials Letters
Volume	237
DOIs	https://doi.org/10.1016/j.matlet.2018.11.095
State	Published - 15 Feb 2019

Keywords

Amorphous materials
Buckling
Post-buckling
Size effect
Thin films

Access to Document

10.1016/j.matlet.2018.11.095

Cite this

@article{bd12e46ee22e48e0970b0e49bd99deb7,

title = "Unique buckling and post-buckling behavior of Cu–Zr amorphous films on compliant substrates",

abstract = "The buckling and post-buckling behavior of the Cu–Zr amorphous films is highly dependent on film thickness (h) and applied strain (ε). A buckling map has been developed with h and ε as axes, where four buckling modes are detected, including uncracked triangular buckle, cracked rectangular buckle, cracked triangular buckle, and patches. Formation of the four buckling modes will be discussed in terms of the film thickness and size-dependent deformation.",

keywords = "Amorphous materials, Buckling, Post-buckling, Size effect, Thin films",

author = "K. Wu and Wang, \{Y. Q.\} and Yuan, \{H. Z.\} and Zhang, \{J. Y.\} and G. Liu and J. Sun",

note = "Publisher Copyright: {\textcopyright} 2018 Elsevier B.V.",

year = "2019",

month = feb,

day = "15",

doi = "10.1016/j.matlet.2018.11.095",

language = "英语",

volume = "237",

pages = "118--121",

journal = "Materials Letters",

issn = "0167-577X",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Unique buckling and post-buckling behavior of Cu–Zr amorphous films on compliant substrates

AU - Wu, K.

AU - Wang, Y. Q.

AU - Yuan, H. Z.

AU - Zhang, J. Y.

AU - Liu, G.

AU - Sun, J.

PY - 2019/2/15

Y1 - 2019/2/15

N2 - The buckling and post-buckling behavior of the Cu–Zr amorphous films is highly dependent on film thickness (h) and applied strain (ε). A buckling map has been developed with h and ε as axes, where four buckling modes are detected, including uncracked triangular buckle, cracked rectangular buckle, cracked triangular buckle, and patches. Formation of the four buckling modes will be discussed in terms of the film thickness and size-dependent deformation.

AB - The buckling and post-buckling behavior of the Cu–Zr amorphous films is highly dependent on film thickness (h) and applied strain (ε). A buckling map has been developed with h and ε as axes, where four buckling modes are detected, including uncracked triangular buckle, cracked rectangular buckle, cracked triangular buckle, and patches. Formation of the four buckling modes will be discussed in terms of the film thickness and size-dependent deformation.

KW - Amorphous materials

KW - Buckling

KW - Post-buckling

KW - Size effect

KW - Thin films

UR - https://www.scopus.com/pages/publications/85056719051

U2 - 10.1016/j.matlet.2018.11.095

DO - 10.1016/j.matlet.2018.11.095

M3 - 文章

AN - SCOPUS:85056719051

SN - 0167-577X

VL - 237

SP - 118

EP - 121

JO - Materials Letters

JF - Materials Letters

ER -

Unique buckling and post-buckling behavior of Cu–Zr amorphous films on compliant substrates

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this