@inbook{11f951139fc74fa59aa781be9a5b84f9,
title = "Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration",
keywords = "Contrast, NCSI imaging, Picometre microscopy, ferroelectric domain walls, Spherical aberration, Ultrahigh-resolution TEM",
author = "Urban, \{Knut W.\} and Juri Barthel and Lothar Houben and Jia, \{Chun Lin\} and Markus Lentzen and Andreas Thust and Karsten Tillmann",
year = "2012",
month = may,
day = "23",
doi = "10.1002/9783527641864.ch3",
language = "英语",
isbn = "9783527317066",
volume = "1",
pages = "81--107",
booktitle = "Handbook of Nanoscopy",
publisher = "Wiley-VCH",
}