Ultra-high-sensitivity microaccelerometer achieved by pure axial deformation of piezoresistive beams

Microfabricated piezoresistive accelerometers with purely axially deformed piezoresistive beams have demonstrated high performance. However, the conventional design of such accelerometers requires complex theoretical calculations and specific dimensional conditions to achieve purely axial deformation, which inevitably increases the difficulty and cost of the design and manufacturing. We propose an innovative structure that can simply realize pure axial deformation of piezoresistive beams by eliminating the transverse displacement at both ends without tedious calculations. An accelerometer based on the structure was fabricated; both static and dynamic performances were tested. The results showed that the accelerometer had high sensitivity (2.44 mV g⁻¹ with 5 V bias, without circuit amplification), low cross-axis sensitivity (1.56% and 0.49 %, respectively), and high natural frequency (11.4 kHz), with a measurement range of 0–100 g. This design method provides an easy approach for designing high-performance piezoresistive sensors.