TY - GEN
T1 - Trapping parameters comparison between cable sections from different service conditions by a new trapping-detrapping model
AU - Liu, Ning
AU - Chen, George
AU - Xu, Yang
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/12/22
Y1 - 2014/12/22
N2 - Space charge formation will cause electric field enhancement at certain location in the polymeric materials, especially under HVDC insulation condition. In our previous works, a model has been developed which is suitable for analysing the space charge data from depolarization test to calculate the material trapping parameters. In the present paper, two cross-linked polyethylene (XLPE) cables, taken from HVAC service condition of 220kV for 12 years and for 8 years, were peeled as 100-200μm films from the outer to inner layer of insulation. Through the comparison between trapping parameters estimated from our model, it has been found that samples from inner insulation layers for both cables have the deepest trap depth and the greatest deep trap density, indicating samples from inner layers have the severest ageing.
AB - Space charge formation will cause electric field enhancement at certain location in the polymeric materials, especially under HVDC insulation condition. In our previous works, a model has been developed which is suitable for analysing the space charge data from depolarization test to calculate the material trapping parameters. In the present paper, two cross-linked polyethylene (XLPE) cables, taken from HVAC service condition of 220kV for 12 years and for 8 years, were peeled as 100-200μm films from the outer to inner layer of insulation. Through the comparison between trapping parameters estimated from our model, it has been found that samples from inner insulation layers for both cables have the deepest trap depth and the greatest deep trap density, indicating samples from inner layers have the severest ageing.
UR - https://www.scopus.com/pages/publications/84936763694
U2 - 10.1109/CEIDP.2014.6995737
DO - 10.1109/CEIDP.2014.6995737
M3 - 会议稿件
AN - SCOPUS:84936763694
T3 - 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014
SP - 449
EP - 452
BT - 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2014
Y2 - 19 October 2014 through 22 October 2014
ER -