TY - GEN
T1 - Tool edge Chipping Monitoring Method based on Synchronous Envelope Orientation Mapping
AU - Ma, Biao
AU - Zhang, Yue
AU - Wang, Mengtao
AU - Zhao, Ming
AU - Yang, Juntao
N1 - Publisher Copyright:
© 2026 IEEE.
PY - 2026
Y1 - 2026
N2 - Reliable detection of initial tool edge chipping in precision milling remains a critical challenge, as subtle fault features are often submerged in strong background noise and runout interference. To address this, this study proposes a novel vibration monitoring framework: Synchronous Envelope Orientation Mapping (SEOM). The methodology begins with an amplitude maximization strategy for strict integer-period truncation to ensure spectral accuracy. A narrowband synchronous envelope algorithm is then applied, specifically extracting higher-order edge-pass harmonics to decouple chipping-induced impacts from low-frequency eccentricity. The resulting energy distribution is visualized via polar orientation mapping, generating intuitive "petal diagrams" that reveal the health status of individual cutting edges. Furthermore, to overcome the limitations of manual visual inspection, a quantitative metric named the Polar Asymmetry Factor (PAF) is constructed to automatically assess damage severity. Results indicate that the PAF maintains high sensitivity even for micro-chipping (0.2 mm) and exhibits a monotonic positive correlation with fault evolution, providing a robust and interpretable solution for intelligent tool condition monitoring.
AB - Reliable detection of initial tool edge chipping in precision milling remains a critical challenge, as subtle fault features are often submerged in strong background noise and runout interference. To address this, this study proposes a novel vibration monitoring framework: Synchronous Envelope Orientation Mapping (SEOM). The methodology begins with an amplitude maximization strategy for strict integer-period truncation to ensure spectral accuracy. A narrowband synchronous envelope algorithm is then applied, specifically extracting higher-order edge-pass harmonics to decouple chipping-induced impacts from low-frequency eccentricity. The resulting energy distribution is visualized via polar orientation mapping, generating intuitive "petal diagrams" that reveal the health status of individual cutting edges. Furthermore, to overcome the limitations of manual visual inspection, a quantitative metric named the Polar Asymmetry Factor (PAF) is constructed to automatically assess damage severity. Results indicate that the PAF maintains high sensitivity even for micro-chipping (0.2 mm) and exhibits a monotonic positive correlation with fault evolution, providing a robust and interpretable solution for intelligent tool condition monitoring.
KW - Edge chipping
KW - Polar orientation mapping
KW - Synchronous Envelope
KW - TSA
UR - https://www.scopus.com/pages/publications/105048899150
U2 - 10.1109/ICCAD69956.2026.11643041
DO - 10.1109/ICCAD69956.2026.11643041
M3 - 会议稿件
AN - SCOPUS:105048899150
T3 - 2026 International Conference on Control, Automation and Diagnosis, ICCAD 2026
BT - 2026 International Conference on Control, Automation and Diagnosis, ICCAD 2026
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2026 International Conference on Control, Automation and Diagnosis, ICCAD 2026
Y2 - 7 July 2026 through 9 July 2026
ER -