Abstract
Nanoindentation creep test has been carried out in displacement of 4-100 nm regime at single grained (SG) Cu and ultrafine grained (UFG) Cu. The strain rate sensitivity m has been determined and exhibits strong indentation size effect. The magnitudes of m in UFG and SG Cu are comparable and can be simulated by the same curve below a critical depth. The authors experimental findings and analysis support that the tip-sample diffusion is the dominant mechanism below a critical indentation depth and the effect of grain boundary media mechanisms will emerge as the indenter penetrates deeper.
| Original language | English |
|---|---|
| Article number | 161921 |
| Journal | Applied Physics Letters |
| Volume | 90 |
| Issue number | 16 |
| DOIs | |
| State | Published - 2007 |