TY - JOUR
T1 - Theoretical Model of EnDP to Achieve Energy-Efficient SRAM
AU - Zhang, Jie
AU - Li, Dan
AU - Fan, Shiquan
AU - Guo, Zhuoqi
AU - Hu, Weibo
AU - Geng, Li
N1 - Publisher Copyright:
© 2004-2012 IEEE.
PY - 2017/8
Y1 - 2017/8
N2 - New tradeoff metric of the energyn-delay product (EnDP, n>1) for energy efficiency design is proposed in this paper. Compared with the conventional energy-delay product metric, the new metric puts more weight on energy than delay, more suitable for those power-critical mid/low-speed applications. We first establish the theoretical model, and then provide comprehensive optimum design points for various processes and applications as energy-efficient design guidelines. We also find that the optimum EnDP operation coincides with the well-known near-threshold methodology, and discuss the challenges and possible design methods. An enhanced hierarchical bit-line structure along with 8T-SRAM cell and local read/write assist circuits is introduced for robust operation and energy efficiency improvement, facilitating EnDP methodology. Finally, an 8-kb SRAM macro in 180-nm CMOS technology for ultra-low-power applications is designed and fabricated to validate the methodology, where a supply voltage of 1.54 is applied to obtain maximum energy efficiency based on E2DP metric. The minimum E2DP of 610 pJ2/GHz is obtained at 0.65 V, fitting the theoretical analysis accurately. Power consumption at 0.65 V is , only 2.6% of that at nominal voltage, 1.8 V. The test chip can operate correctly from 1.8to 0.6 V with frequency scaling from 400 to 15.5 MHz.
AB - New tradeoff metric of the energyn-delay product (EnDP, n>1) for energy efficiency design is proposed in this paper. Compared with the conventional energy-delay product metric, the new metric puts more weight on energy than delay, more suitable for those power-critical mid/low-speed applications. We first establish the theoretical model, and then provide comprehensive optimum design points for various processes and applications as energy-efficient design guidelines. We also find that the optimum EnDP operation coincides with the well-known near-threshold methodology, and discuss the challenges and possible design methods. An enhanced hierarchical bit-line structure along with 8T-SRAM cell and local read/write assist circuits is introduced for robust operation and energy efficiency improvement, facilitating EnDP methodology. Finally, an 8-kb SRAM macro in 180-nm CMOS technology for ultra-low-power applications is designed and fabricated to validate the methodology, where a supply voltage of 1.54 is applied to obtain maximum energy efficiency based on E2DP metric. The minimum E2DP of 610 pJ2/GHz is obtained at 0.65 V, fitting the theoretical analysis accurately. Power consumption at 0.65 V is , only 2.6% of that at nominal voltage, 1.8 V. The test chip can operate correctly from 1.8to 0.6 V with frequency scaling from 400 to 15.5 MHz.
KW - Energy efficiency
KW - SRAM
KW - energy-delay product (EDP)
KW - near-threshold operation
KW - optimum supply voltage
UR - https://www.scopus.com/pages/publications/85029359366
U2 - 10.1109/TCSI.2017.2687060
DO - 10.1109/TCSI.2017.2687060
M3 - 文章
AN - SCOPUS:85029359366
SN - 1549-8328
VL - 64
SP - 2049
EP - 2062
JO - IEEE Transactions on Circuits and Systems I: Regular Papers
JF - IEEE Transactions on Circuits and Systems I: Regular Papers
IS - 8
M1 - 7993405
ER -